C8051F120-GQR

Product Summary

The C8051F120-GQR is a fully integrated mixed-signal System-on-a-Chip MCU with 64 digital I/O pins (100-pin TQFP) or 32 digital I/O pins (64-pin TQFP). With on-chip VDD monitor, Watchdog Timer, and clock oscillator, the C8051F120-GQR is truly stand-alone System-on-a-Chip solutions. All analog and digital peripherals are enabled/disabled and configured by user firmware. The Flash memory can be reprogrammed even in-circuit, providing non-volatile data storage, and also allowing field upgrades of the 8051 firmware.

Parametrics

C8051F120-GQR absolute maximum ratings: (1)Ambient temperature under bias: –55 to 125℃; (2)Storage Temperature: –65 to 150℃; (3)Voltage on any Pin (except VDD and Port I/O) with Respect to DGND: –0.3 to VDD + 0.3V; (4)Voltage on any Port I/O Pin or RST with Respect to DGND: –0.3 to 5.8 V; (5)Voltage on VDD with Respect to DGND: –0.3 to 4.2 V; (6)Maximum Total Current through VDD, AV+, DGND, and AGND: 800mA; (7)Maximum Output Current Sunk by any Port pin: 100mA; (8)Maximum Output Current Sunk by any other I/O pin: 50mA; (9)Maximum Output Current Sourced by any Port pin: 100mA; (10)Maximum Output Current Sourced by any other I/O Pin: 50mA.

Features

C8051F120-GQR features: (1)± 1 LSB INL; (2)Programmable throughput up to 100 ksps; (3)Up to 8 external inputs; programmable as single-ended or differential; (4)Programmable amplifier gain: 16, 8, 4, 2, 1, 0.5; (5)Data-dependent windowed interrupt generator; (6)Built-in temperature sensor; (7)Programmable throughput up to 500 ksps; (8)8 external inputs (single-ended or differential); (9)Programmable amplifier gain: 4, 2, 1, 0.5, On-chip debug circuitry facilitates full-speed, non-intrusive in-circuit/in-system debugging; (10)Provides breakpoints, single-stepping, watchpoints, stack monitor; inspect/modify memory and registers; (11)Superior performance to emulation systems using ICE-chips, target pods, and sockets; (12)IEEE1149.1 compliant boundary scan; (13)Complete development kit.

Diagrams